LK Metrology, a British company specializing in precision metrology, has launched the L100NX, a next generation blue laser scanner for coordinate measuring machines (CMMs). Announced in a new product release, the system introduces a 450 nm blue light laser designed to reduce noise, improve data quality, and enhance scanning performance for users in the aerospace, automotive, and industrial sectors.
The L100NX succeeds the company’s L100 red laser scanner with several major upgrades. LK Metrology says the new blue laser reduces scan noise by 26%, enabling cleaner and more reliable datasets for high precision applications. The system combines a 110 mm stripe width with a scanning speed of up to 530,000 points per second, allowing faster inspection of large components.
To support the inspection of multi material components, the scanner incorporates LK’s fourth generation ESP (Enhanced Sensor Performance) technology. ESP automatically adjusts laser power across the 2,000 points on the laser line. According to the company, this allows users to measure reflective surfaces, composites, or mixed material assemblies without preparation, reducing manual intervention and operator workload.
Usability enhancements include an integrated rotation adaptor for easier sensor orientation and an integrated FOV (field of view) projector that displays the coverage area directly onto the part. LK Metrology notes that these features simplify programming, setup, and scanning of complex geometries. The L100NX is supplied in a protective kit with accessories and documentation for operation and maintenance.
Kristof Peeters, Product Manager for laser scanners at LK Metrology, said the L100NX represents “a significant leap forward in laser scanning technology,” highlighting the combination of blue optics and intelligent sensors. “We are delivering a solution that meets the evolving needs of modern manufacturing,” he added.
Blue laser metrology for multi material inspection
Blue laser sensors are increasingly adopted in industrial metrology due to their lower speckle noise and improved performance on dark, shiny, or textured surfaces. For CMM users, this can reduce preparation time and improve repeatability in large batch inspections.
LK Metrology has a long history in the CMM sector. Founded in 1963 by pioneers Norman Key and Jim Lowther, the company is recognized for several milestones in coordinate metrology, including the first bridge type design, the first OEM integration of computers into inspection systems, and the introduction of carbon fiber spindles and microprocessor controlled drives.
After operating as part of Nikon Metrology, LK was relaunched as an independent CMM manufacturer in 2018. Development and production are based in Castle Donington, UK, with offices in Europe, North America, and Asia.
Optical metrology expands with new hardware and integrated software ecosystems
The launch of the L100NX comes at a time when optical metrology is advancing quickly, driven by rising expectations around speed, portability, and measurement fidelity. Recent releases such as Creaform’s HandySCAN 3D EVO Series highlight the industry’s push toward lighter, faster handheld scanners designed to capture high-quality data across a variety of surface conditions.
In parallel, new software ecosystems like Creaform OS and the Creaform Metrology Suite demonstrate how manufacturers increasingly expect seamless scan-to-analysis workflows, automated feature extraction, and simplified data management. The market is also seeing targeted tools for difficult inspection tasks, including systems such as Shining 3D’s FreeProbe Series, which focuses on capturing hard-to-reach features and improving measurement capability in constrained environments.
Together, these developments point to a broader shift toward sensors and software that reduce setup time, expand coverage of challenging surfaces, and deliver consistent accuracy across both portable and CMM-based workflows
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Featured image shows the L100NX blue laser scanner. Image via LK Metrology.
